Monitoring of semiconductor manufacturing process on Bayesian AEWMA control chart under paired ranked set sampling schemes
Abstract Quality control often employs memory-type control charts, including the exponentially weighted moving average (EWMA) and Shewhart control charts, to identify shifts in the location parameter of a process.This article pioneers a new Bayesian Adaptive EWMA (AEWMA) control chart, built on diverse loss functions (LFs) such as the square error